OPS II FIB-SEM

Service Description

Our FIB-SEM Operation course is a comprehensive, hands-on training program designed for users seeking to develop a solid understanding of Focused Ion Beam-Scanning Electron Microscope (FIB-SEM) systems. Over five days, participants will learn the fundamentals of dual-beam operation, including imaging, milling, and basic sample preparation techniques. This course includes: - Overview of FIB-SEM principles and system components - Safe system start-up, alignment, and shutdown procedures - Electron and ion beam imaging techniques - Basic milling operations and pattern creation - Introduction to site-specific sample preparation (e.g., cross-sectioning) - System navigation, parameter adjustment, and data acquisition - Routine maintenance and basic troubleshooting By the end of the course, participants will have the confidence and skills to independently operate a FIB-SEM system for standard imaging and milling tasks.