OPS III Lamella Prep

Service Description

This intensive Advanced Lamella Preparation course is designed for experienced FIB-SEM users looking to master high-quality, site-specific TEM lamella preparation. Over five days, participants will gain hands-on experience with advanced milling techniques, artifact reduction, and strategies to improve throughput and success rates. This course includes: - Advanced FIB milling techniques for thin, uniform lamellae - Site-specific lift-out and transfer methods - End-point detection and thickness control strategies - Minimizing curtaining, bending and contamination artifacts - Preparation for high-resolution and cryo-TEM workflows - Best practices for repeatable, high-quality results - Expert guidance and troubleshooting in real-time By the end of this course, participants will be equipped to produce TEM-ready lamellae with improved precision, consistency, and confidence.